Electronic Load  1.0
Programmable Constant Current Sink
ftest.h
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1 /*
2  * ftest.h
3  *
4  * Created: 19.02.2013 17:17:27
5  * Author: Robert
6  */
7 
8 
9 #ifndef FTEST_H_
10 #define FTEST_H_
11 
12 #include <stdbool.h>
13 
20 typedef struct
21 {
22  volatile uint8_t *port;
23  volatile uint8_t *pin;
24  volatile uint8_t *ddr;
25  uint8_t testMask;
27 
28 extern bool FTest(void);
29 extern void FTest485(void);
30 
31 
32 #endif /* FTEST_H_ */
volatile uint8_t * ddr
Address of the DDRc-register.
Definition: ftest.h:24
bool FTest(void)
Performs a simple Factory Test.
Definition: ftest.c:276
void FTest485(void)
volatile uint8_t * port
Address of the PORTx-register.
Definition: ftest.h:22
Holds the test declarations for one Port.
Definition: ftest.h:20
uint8_t testMask
Bit mask of which pins to test. All 1-bits are tested.
Definition: ftest.h:25
volatile uint8_t * pin
Address of the PINx-register.
Definition: ftest.h:23