23 volatile uint8_t *
pin;
24 volatile uint8_t *
ddr;
28 extern bool FTest(
void);
volatile uint8_t * ddr
Address of the DDRc-register.
Definition: ftest.h:24
bool FTest(void)
Performs a simple Factory Test.
Definition: ftest.c:276
volatile uint8_t * port
Address of the PORTx-register.
Definition: ftest.h:22
Holds the test declarations for one Port.
Definition: ftest.h:20
uint8_t testMask
Bit mask of which pins to test. All 1-bits are tested.
Definition: ftest.h:25
volatile uint8_t * pin
Address of the PINx-register.
Definition: ftest.h:23