Electronic Load 1.0 Programmable Constant Current Sink

ftest.h
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1 /*
2 * ftest.h
3 *
4 * Created: 19.02.2013 17:17:27
5 * Author: Robert
6 */
7
8
9 #ifndef FTEST_H_
10 #define FTEST_H_
11
12 #include <stdbool.h>
13
20 typedef struct
21 {
22 volatile uint8_t *port;
23 volatile uint8_t *pin;
24 volatile uint8_t *ddr;
25 uint8_t testMask;
26 } ftestPortsStruct;
27
28 extern bool FTest(void);
29 extern void FTest485(void);
30
31
32 #endif /* FTEST_H_ */
ftestPortsStruct::ddr
volatile uint8_t * ddr
Address of the DDRc-register.
Definition: ftest.h:24
FTest
bool FTest(void)
Performs a simple Factory Test.
Definition: ftest.c:276
FTest485
void FTest485(void)
ftestPortsStruct::port
volatile uint8_t * port
Address of the PORTx-register.
Definition: ftest.h:22
ftestPortsStruct
Holds the test declarations for one Port.
Definition: ftest.h:20
ftestPortsStruct::testMask
uint8_t testMask
Bit mask of which pins to test. All 1-bits are tested.
Definition: ftest.h:25
ftestPortsStruct::pin
volatile uint8_t * pin
Address of the PINx-register.
Definition: ftest.h:23